MIS tunnel diode as a low energy X-ray and gamma-ray detector
Description
Highly perfect n-type cadmium telluride single crystals have been used to fabricate semiconductor detectors for X-ray and low energy gamma-ray spectrometry at room temperature. The detectors are of MIS tunnel diode type. Between the metal (M) and the semiconducting CdTe crystals (S) there is a thin insulator (D) with a critical value of thickness. The mechanism for a current condition is tunneling through the insulator. Our studies by SIMS and ellipsometry show that there is a nonstoichiometric region between the insulator and the semiconductor and in the insulator with thickness below 30 A. The effect of the nonstoichiometry in the MIS structure upon spectrometric performance of the detector has been analyzed. A considerable improvement of the energy resolution for full energy peak can be achieved by appropriate interfaces of the MIS tunnel detectors. The Np - Lα (13.9 keV), Np -Lβ (17.7 keV) and Np -Lγ (20.8 keV) X-ray are clearly resolved. The spectrum of the characteristic X-ray from 55Fe source (5.9 keV) shows the energy resolution to 0.9 keV (FWHM) at room temperature. (author)
Additional details
Additional titles
- Subtitle (English)
- Poster K-9
Publishing Information
- Imprint Title
- 26. colloquium spectroscopicum international. Vol. 1. Posters A to L
- Imprint Pagination
- 284 p.
- Journal Page Range
- p. 242-243.
Conference
- Title
- 26. colloquium spectroscopicum internationale (CSI) and instrument exhibition.
- Dates
- 2-9 Jul 1989.
- Place
- Sofia (Bulgaria).
INIS
- Country of Publication
- Bulgaria
- Country of Input or Organization
- Bulgaria
- INIS RN
- 25019090
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Numerical Data, Non-conventional Literature
- Descriptors DEI
- CDTE SEMICONDUCTOR DETECTORS; ENERGY RESOLUTION; EXPERIMENTAL DATA; GAMMA DETECTION; GAMMA SPECTROSCOPY; INTERFACES; KEV RANGE; MONOCRYSTALS; OPTICAL PROPERTIES; STOICHIOMETRY; THICKNESS; TUNNEL DIODES; X-RAY DETECTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- CRYSTALS; DATA; DETECTION; DIMENSIONS; ENERGY RANGE; INFORMATION; MEASURING INSTRUMENTS; NUMERICAL DATA; PHYSICAL PROPERTIES; RADIATION DETECTION; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SPECTROSCOPY