Published May 2016
| Version v1
Journal article
Lifetime of excitons localized in Si nanocrystals in amorphous silicon
Creators
- 1. Ioffe Institute (Russian Federation)
- 2. R and D Center of thin-film technology for energetic under Ioffe Physicotechnical Institute (Russian Federation)
Description
The introduction of nanocrystals plays an important role in improving the stability of the amorphous silicon films and increasing the carrier mobility. Here we report results of the study on the photoluminescence and its dynamics in the films of amorphous hydrogenated silicon containing less than 10% of silicon nanocrystals. The comparing of the obtained experimental results with the calculated probability of the resonant tunneling of the excitons localized in silicon nanocrystals is presented. Thus, it has been estimated that the short lifetime of excitons localized in Si nanocrystal is controlled by the resonant tunneling to the nearest tail state of the amorphous matrix.
Additional details
Identifiers
Publishing Information
- Journal Title
- Semiconductors
- Journal Volume
- 50
- Journal Issue
- 5
- Journal Page Range
- p. 627-631
- ISSN
- 1063-7826
- CODEN
- SMICES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 48094140
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AMORPHOUS STATE; CARRIER MOBILITY; COMPARATIVE EVALUATIONS; EXCITONS; HYDROGENATION; LIFETIME; MATRIX MATERIALS; NANOSTRUCTURES; PHASE STABILITY; PHOTOLUMINESCENCE; SILICON; THIN FILMS; TUNNEL EFFECT
- Descriptors DEC
- CHEMICAL REACTIONS; ELEMENTS; EMISSION; EVALUATION; FILMS; LUMINESCENCE; MATERIALS; MOBILITY; PHOTON EMISSION; QUASI PARTICLES; SEMIMETALS; STABILITY
Optional Information
- Copyright
- Copyright (c) 2016 Pleiades Publishing, Ltd.