Published January 2003 | Version v1
Journal article Metadata-only

Oscillations of the critical temperature in superconducting Nb/Ni bilayers

Creators

  • 1. Institut fuer Physik, Universitaet Augsburg, 86135 Augsburg (Germany)
  • 2. Institute of Applied Physics, LISES, 2028 Kishinev (Moldova, Republic of)
  • 3. I. Physikalisches Institut, Universitaet Goettingen, 37073 Goettingen (Germany)
  • 4. Kazan State University, 420008 Kazan (Russian Federation)

Description

We investigated Nb/Ni bilayers prepared by magnetron sputtering on glass substrates. The quality of the films was characterized by small-angle X-ray diffraction analysis. The thickness of the layers was determined by the Rutherford backscattering spectrometry (RBS). For specimens with constant Nb layer thickness we observed distinct oscillations of the superconducting critical temperature upon increasing the thickness of the Ni layer. The results are interpreted in terms of Fulde-Ferrell-Larkin-Ovchinnikov (FFLO) like inhomogeneous superconducting pairing in the ferromagnetic Ni Layer. (Abstract Copyright [2003], Wiley Periodicals, Inc.)

Availability note (English)

Available from: http://dx.doi.org/10.1002/andp.200310005

Additional details

Identifiers

URL
http://www.interscience.wiley.com;
DOI
10.1002/andp.200310005;

Publishing Information

Journal Title
Annalen der Physik (Leipzig)
Journal Volume
12
Journal Issue
1-2
Journal Page Range
p. 37-50
ISSN
0003-3804

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
34036083
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Descriptors DEI
BACKSCATTERING; CRITICAL TEMPERATURE; ENERGY SPECTRA; LAYERS; NICKEL; NIOBIUM; OSCILLATIONS; PAIRING INTERACTIONS; RUTHERFORD SCATTERING; SMALL ANGLE SCATTERING; SUPERCONDUCTING FILMS; SUPERCONDUCTIVITY; SUPERCONDUCTORS; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; THICKNESS; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; ELASTIC SCATTERING; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; INTERACTIONS; METALS; PHYSICAL PROPERTIES; REFRACTORY METALS; SCATTERING; SPECTRA; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENTS; TRANSITION TEMPERATURE

Optional Information

Notes
With 8 figs., 69 refs.. SICI: 0003-3804(20030327)12:1/2<37::AID-ANDP"200310005>3.0.TX;2-5