Published July 1994
| Version v1
Journal article
Quantification in low-energy ion scattering: elemental sensitivity factors and charge exchange processes
Creators
- 1. Faculty of Physics and Schuit Institute of Catalysis, Eindhoven University of Technology, N-laag, P.O. Box 513, 5600 MB Eindhoven (Netherlands)
Description
For quantitative analysis in Low Energy Ion Scattering (LEIS), elemental sensitivity factors are needed. Here, these factors are presented for 1 keV He+ scattering from a number of pure metals. The influence of different properties of the target on neutralization of the incident ions has been studied and elemental specific neutralization constants (characteristic velocities) have been measured. An enhanced neutralization was found for elements for which ionization plays an important role. A qualitative explanation is given for this observation. ((orig.))
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 93
- Journal Issue
- 2
- Journal Page Range
- p. 149-155.
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 26013995
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- BEAM NEUTRALIZATION; CHARGE EXCHANGE; EV RANGE 100-1000; HELIUM IONS; ION SCATTERING ANALYSIS; IONIZATION; KEV RANGE 01-10; METALS; SCATTERING; SENSITIVITY
- Descriptors DEC
- CHARGED PARTICLES; CHEMICAL ANALYSIS; ELEMENTS; ENERGY RANGE; EV RANGE; IONS; KEV RANGE; NONDESTRUCTIVE ANALYSIS