Published April 14, 2004
| Version v1
Journal article
Laboratory high-pressure single-crystal x-ray diffraction-recent improvements and examples of studies
Creators
- 1. Institut de Chimie de la Matiere Condensee de Bordeaux (ICMCB), UPR CNRS 9048, Universite Bordeaux I, Avenue du Docteur A Schweitzer, F-33608 Pessac (France)
Description
Some recent improvements made to the high-pressure single-crystal x-ray diffraction (XRD) experiments in use in our laboratory are reviewed. In particular a set-up to perform high-pressure (0-3.0 GPa)-low-temperature (300-9 K) investigations as well as a protocol for high-pressure XRD data collection using a CCD detector are shown. Examples of studies are also presented
Availability note (English)
Available online at http://stacks.iop.org/0953-8984/16/S1151/cm4_14_025.pdf or at the Web site for the Journal of Physics. Condensed Matter (ISSN 1361-648X) http://www.iop.org/Additional details
Identifiers
- URL
- http://stacks.iop.org/0953-8984/16/S1151/cm4_14_025.pdf; http://www.iop.org/;
- DOI
- 10.1088/0953-8984/16/14/025;
- PII
- S0953-8984(04)74880-8;
Publishing Information
- Journal Title
- Journal of Physics. Condensed Matter
- Journal Volume
- 16
- Journal Issue
- 14
- Journal Page Range
- p. S1151-S1159
- ISSN
- 0953-8984
- CODEN
- JCOMEL
Conference
- Title
- Joint 19. and 41. EHPRG international conference on high pressure science and technology
- Dates
- 7-11 Jul 2003
- Place
- Bordeaux (France)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 36000601
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHARGE-COUPLED DEVICES; MONOCRYSTALS; PRESSURE RANGE GIGA PA; TEMPERATURE RANGE 0065-0273 K; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTALS; DIFFRACTION; PRESSURE RANGE; SCATTERING; SEMICONDUCTOR DEVICES; TEMPERATURE RANGE