Application of CTOF method to detect secondly charged particle from 2 GeV electron
- 1. High Energy Accelerator Research Organization, Tsukuba, Ibaraki (Japan)
- 2. Pohang Accelerator Laboratory, Pohang, Kyungbuk (Korea, Republic of)
- 3. Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment
Description
To design a shield and evaluate leakage radiation at high energy electron accelerators, the energy and angular data of secondary particle from the reaction of electrons with structural materials are required. Secondly neutron spectrum from structural materials has been measured by using electron accelerator in PAL (Pohang Accelerator Laboratory). In the neutron measurement, the electronics with Multi-hit TDC (MHTDC) was adopted to measure Time of Flight of every particles (TOFs) emitted from the reactions by each single electron bunch. The measurements are extended to secondly charged particles. For the charged particles measurement, the pulse height data for every particles are indispensable to distinguish charged particles by Δ E-E method. A new system which can measure pulse height for every particle is required instead of the MHTDC system. For this requirement, the method which can take output current from detectors was developed by using digital storage oscilloscope system is named ''Current Time of Flight method'' (CTOF). The CTOF method is able to measure pulse height and TOF for every particles produced by single electron bunch. Electrons are accelerated to 2.04 GeV and the repetition rate is 10 Hz. These electrons bombard thin disk samples of Cu 1mm, Al 4 mm and W 0.5 mm. Secondly charged particles, proton and deuteron, are produced in the samples by photonuclear reaction. Two dimensional of Δ E-E spectrum for each the samples measured by CTOF shows separation between proton and deuteron perfectly. Thus, proton and deuteron spectrum are obtained from this data. (M. Suetake)
Additional details
Publishing Information
- Imprint Title
- Proceedings of the 16th workshop on radiation detectors and their uses
- Imprint Pagination
- 198 p.
- Journal Page Range
- p. 85-94
- Report number
- KEK-PROC--2002-12
Conference
- Title
- 16. workshop on radiation detectors and their uses
- Dates
- 6-8 Feb 2002
- Place
- Tsukuba, Ibaraki (Japan)
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 34029367
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference, Non-conventional Literature
- Descriptors DEI
- CHARGED PARTICLE DETECTION; COPPER; DEUTERON SPECTRA; ELECTRON BEAMS; GEV RANGE 01-10; LINEAR ACCELERATORS; PLASTIC SCINTILLATION DETECTORS; PROTON SPECTRA; SECONDARY REACTIONS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- ACCELERATORS; BEAMS; DETECTION; ELEMENTS; ENERGY RANGE; GEV RANGE; LEPTON BEAMS; MEASURING INSTRUMENTS; METALS; NUCLEAR REACTIONS; PARTICLE BEAMS; RADIATION DETECTION; RADIATION DETECTORS; SCINTILLATION COUNTERS; SOLID SCINTILLATION DETECTORS; SPECTRA; TRANSITION ELEMENTS
Optional Information
- Notes
- 3 refs., 9 figs.