Published 2008 | Version v1
Journal article

Modes of low-pressure dual-frequency (27/2 MHz) discharges in hydrogen

  • 1. Depart. Physics and Technol., Kharkov National Univ., Kharkov 61077, (Russian Federation)
  • 2. Lab. Phys. Technol. Plasmas, Ecole Polytechnique, F-91128 Palaiseau, (France)
  • 3. Uniaxis Displays Div. France, SAS, F-91120 Palaiseau, (France)
  • 4. CEA Cadarache, DRFC, Assoc. Euratom-CEA, F-13108 Saint Paul lez Durance (France)
  • 5. Riber, F-95873 Bezons, (France)
  • 6. Depart. Physics, Kharkov Nat. Univ., Kharkov 61077 (Russian Federation)

Description

This paper studies the modes of dual-frequency (high-frequency (HF)/low-frequency (LF)) low-pressure discharges. The dual-frequency discharges are shown to burn in one of three possible modes. At small LF voltages the first mode is observed, i.e. the HF discharge perturbed by the LF voltage. The second mode, i.e. the combined discharge, exists in the presence of intense ionization in the sheaths, when the LF voltage exceeds some critical value. The third mode (the LF discharge perturbed by an HF field) is observed when a small HF voltage is applied to the burning LF discharge. The range of parameters within which the first mode of the combined discharge may be extinguished by the LF voltage increase is shown to be limited by the HF discharge extinction curve from the low-pressure side as well as the lowest HF voltage for the transition of the discharge from the first mode to the second one. (authors)

Availability note (English)

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Additional details

Publishing Information

Journal Title
Plasma Sources Science and Technology
Journal Volume
17
Journal Issue
no.2
Journal Page Range
p. 1-6
ISSN
0963-0252

INIS

Country of Publication
France
Country of Input or Organization
France
INIS RN
41034492
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
BREAKDOWN; ELECTRIC FIELDS; HIGH-FREQUENCY DISCHARGES; ION DENSITY; IONIZATION; PLASMA SHEATH; PLASMA SIMULATION; RF SYSTEMS
Descriptors DEC
ELECTRIC DISCHARGES; SIMULATION

Optional Information

Notes
38 refs.