Published 2006
| Version v1
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New method of diagnostics of multiply charged ion beams from the mVINIS ion source
Creators
- 1. Elektrotehnicki fakultet, Belgarde (Serbia and Montenegro)
- 2. Institute of nuclear sciences Vinca, Belgrade (Serbia and Montenegro)
Description
In order to determine the position, dimension and intensity of multiply charged ion beams from the mVINIS Ion Source, a new method was developed based on a fluorescent screen and CCD camera. The characteristics of a number of multiply charged ion beams were precisely measured and analyzed (e.g. ion beam of Ar2+ to Ar10+). The measurements of the Ar8+ ion beam were discussed in detail. The characteristics obtained were compared to the results produced using the conventional method of ion beam diagnostics. (author)
Availability note (English)
Available from INIS in electronic form; Also available from the Institute of Nuclear Sciences VINCAFiles
38015787.pdf
Files
(6.8 MB)
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Additional details
Additional titles
- Original title (Serbian)
- Nova metoda dijagnstike snopova visestruko naelektrisanih jona is jonskog izvora mVINIS
Publishing Information
- Publisher
- Society for Electronics,Telecommunications, Computers, Automation, and Nuclear Engineering
- Imprint Place
- Belgrade (Serbia and Montenegro)
- Imprint Pagination
- 4 p.
- Report number
- INIS-RS--0567
Conference
- Title
- Society for Electronics, Telecommunications, Computers, Automation, and Nuclear Engineering
- Original Conference Title
- ETRAN '06: 50. Konferencija za elektroniku, telekomunikacije, racunarstvo, automatiku i nuklearnu tehniku
- Acronym
- 50. Conference - ETRAN '06
- Dates
- 6-8 Jun 2006
- Place
- Belgrade (Serbia and Montenegro)
INIS
- Country of Publication
- Serbia
- Country of Input or Organization
- Serbia
- INIS RN
- 38015787
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; BEAM POSITION; BEAM PROFILES; CHARGE-COUPLED DEVICES; ION BEAMS; MEASURING METHODS
- Descriptors DEC
- BEAMS; CHARGED PARTICLES; IONS; SEMICONDUCTOR DEVICES
Optional Information
- Notes
- 7 refs., 8 figs., 1 tab.