Published 1975 | Version v1
Report Restricted

2nd international conference on ion beam surface layer analysis

Creators

Description

The papers of this conference are concerned with the fundamental aspects and with the application of surface layer analysis. It is reported amongst others about backscattering analysis, Auger electron spectroscopy, channelling and microprobe. (HPOE)

Availability note (English)

MF available from INIS under the Report Number.

Abstract (German)

Die Vortraege dieser Konferenz befassen sich mit den Grundlagen und der Anwendung von Methoden zur Untersuchung oberflaechennaher Bereiche. Es wird u.a. ueber Rueckstreuungsanalyse, Augerelektronenspektroskopie, Channelling und Mikrosonde berichtet. (HPOE)

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Additional details

Additional titles

Subtitle (English)
Programme and conference abstracts

Publishing Information

Imprint Pagination
vp.
Report number
AED-Conf--75-478-000

Conference

Title
2. international conference on ion beam surface layer analysis.
Dates
15 Sep 1975.
Place
Karlsruhe, F.R. Germany.

INIS

Country of Publication
Germany
Country of Input or Organization
Germany
INIS RN
7231648
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
BACKSCATTERING; CHANNELING; ION BEAMS; ION IMPLANTATION; ION SCATTERING ANALYSIS; METALS; PHYSICAL RADIATION EFFECTS; REACTOR MATERIALS; SURFACES; X-RAY SPECTROSCOPY
Descriptors DEC
BEAMS; CHEMICAL ANALYSIS; ELEMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION EFFECTS; SCATTERING; SPECTROSCOPY

Optional Information

Notes
With refs.