Published April 6, 2015
| Version v1
Journal article
High-temperature stability of thermoelectric Ca3Co4O9 thin films
- 1. Faculty of Science and Technology and MESA+ Institute for Nanotechnology, University of Twente, P.O. Box 217, 7500 AE, Enschede (Netherlands)
- 2. Department of Energy Conversion and Storage, Technical University of Denmark, DK-4000 Roskilde (Denmark)
Description
An enhanced thermal stability in thermoelectric Ca3Co4O9 thin films up to 550 °C in an oxygen rich environment was demonstrated by high-temperature electrical and X-ray diffraction measurements. In contrast to generally performed heating in helium gas, it is shown that an oxygen/helium mixture provides sufficient thermal contact, while preventing the previously disregarded formation of oxygen vacancies. Combining thermal cycling with electrical measurements proves to be a powerful tool to study the real intrinsic thermoelectric behaviour of oxide thin films at elevated temperatures
Additional details
Identifiers
- DOI
- 10.1063/1.4917275;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 106
- Journal Issue
- 14
- Journal Page Range
- p. 143903-143903.4
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46104574
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CALCIUM COMPOUNDS; COBALT OXIDES; HEATING; HELIUM; MIXTURES; OXYGEN; TEMPERATURE DEPENDENCE; THERMAL CYCLING; THERMOELECTRIC MATERIALS; THERMOELECTRIC PROPERTIES; THIN FILMS; VACANCIES; X-RAY DIFFRACTION
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COBALT COMPOUNDS; COHERENT SCATTERING; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFRACTION; DISPERSIONS; ELECTRICAL PROPERTIES; ELEMENTS; FILMS; FLUIDS; GASES; MATERIALS; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; POINT DEFECTS; RARE GASES; SCATTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Notes
- (c) 2015 AIP Publishing LLC