Laterally graded multilayers and their applications
- 1. Department of Biological, Chemical and Physical Sciences, Illinois Institute of Technology, Chicago, Illinois 60616 (United States)
- 2. Niels Bohr Institute, Copenhagen University, Copenhagen (Denmark)
- 3. User Program Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
Description
Laterally graded multilayers consisting of uniform W layers and wedge-shaped C layers have been made at the Advanced Photon Source deposition lab for tunable x-ray double-monochromator applications. The double monochromator has two identical graded multilayers in series, as in the conventional double-crystal monochromator arrangement. By letting the x-ray beam hit slightly different (bilayer) d spacing on each multilayer, one can adjust the bandpass and peak energy of the transmitted beam. Also, since the Bragg angles of the two multilayers are not constrained to be the same, the angle of the transmitted beam can be varied in the vertical plane. This option may be an attractive alternative to the conventional way of studying liquid surfaces in reflectivity and grazing-incidence diffraction measurements. The graded multilayer comprised 60 bilayers of W and C on 100x25x3 mm float glass with a d spacing varying from 35 to 60 Aa and an average gradient of 0.27 Aa/mm in the long direction. The films were made by dc magnetron sputtering with the sputtered atoms passing a contoured mask while the substrate was moving. Two different masks were designed to produce either a uniform (for W) or graded (for C) thickness profile. The multilayer and graded multilayers have many other novel applications. Potential applications in x-ray fluorescence detection and x-ray standing wave experiments will be discussed
Additional details
Identifiers
- DOI
- 10.1116/1.1353536;
Publishing Information
- Journal Title
- Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
- Journal Volume
- 19
- Journal Issue
- 4
- Journal Page Range
- p. 1421-1424
- ISSN
- 0734-2101
- CODEN
- JVTAD6
Conference
- Title
- 47. international symposium of the American Vacuum Society
- Dates
- 2-6 Oct 2000
- Place
- Boston, MA (United States)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34071087
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- CARBON; DEPOSITION; EXPERIMENTAL DATA; GAMMA RADIATION; LAYERS; SPUTTERING; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; INFORMATION; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUMERICAL DATA; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2001 American Vacuum Society.