Published July 2001 | Version v1
Journal article

Laterally graded multilayers and their applications

  • 1. Department of Biological, Chemical and Physical Sciences, Illinois Institute of Technology, Chicago, Illinois 60616 (United States)
  • 2. Niels Bohr Institute, Copenhagen University, Copenhagen (Denmark)
  • 3. User Program Division, Argonne National Laboratory, Argonne, Illinois 60439 (United States)

Description

Laterally graded multilayers consisting of uniform W layers and wedge-shaped C layers have been made at the Advanced Photon Source deposition lab for tunable x-ray double-monochromator applications. The double monochromator has two identical graded multilayers in series, as in the conventional double-crystal monochromator arrangement. By letting the x-ray beam hit slightly different (bilayer) d spacing on each multilayer, one can adjust the bandpass and peak energy of the transmitted beam. Also, since the Bragg angles of the two multilayers are not constrained to be the same, the angle of the transmitted beam can be varied in the vertical plane. This option may be an attractive alternative to the conventional way of studying liquid surfaces in reflectivity and grazing-incidence diffraction measurements. The graded multilayer comprised 60 bilayers of W and C on 100x25x3 mm float glass with a d spacing varying from 35 to 60 Aa and an average gradient of 0.27 Aa/mm in the long direction. The films were made by dc magnetron sputtering with the sputtered atoms passing a contoured mask while the substrate was moving. Two different masks were designed to produce either a uniform (for W) or graded (for C) thickness profile. The multilayer and graded multilayers have many other novel applications. Potential applications in x-ray fluorescence detection and x-ray standing wave experiments will be discussed

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Vacuum Science and Technology. A, Vacuum, Surfaces and Films
Journal Volume
19
Journal Issue
4
Journal Page Range
p. 1421-1424
ISSN
0734-2101
CODEN
JVTAD6

Conference

Title
47. international symposium of the American Vacuum Society
Dates
2-6 Oct 2000
Place
Boston, MA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
34071087
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
CARBON; DEPOSITION; EXPERIMENTAL DATA; GAMMA RADIATION; LAYERS; SPUTTERING; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS
Descriptors DEC
CHEMICAL ANALYSIS; DATA; ELECTROMAGNETIC RADIATION; ELEMENTS; INFORMATION; IONIZING RADIATIONS; METALS; NONDESTRUCTIVE ANALYSIS; NONMETALS; NUMERICAL DATA; RADIATIONS; REFRACTORY METALS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS

Optional Information

Notes
(c) 2001 American Vacuum Society.