In situ video-scanning tunneling microscopy studies of the structure and dynamics of Cl adlayers on Au(1 0 0) electrodes
- 1. Institute of Experimental and Applied Physics, University Kiel, Olshausenstr. 40, 24098 Kiel (Germany)
Description
The chloride adlayer on Au(1 0 0) electrodes in 0.01 M HCl solution was studied on the atomic scale by in situ high-speed scanning tunneling microscopy. In the potential regime 0–0.4 VAg/AgCl a hitherto not reported defective c(2 × 2) structure was observed. In addition to characteristic straight domain boundaries oriented along the [0 1 0] and [0 1 1] directions of the Au substrate, unusual chain-like adsorbate structures were found. These defects can exhibit open structures with locally lower coverage as well as more close-packed arrangements, in which the adsorbates deviate from the lattice sites and have a 15% reduced nearest neighbor spacing. Dynamic fluctuations within the adlayer occur on the time scale of seconds, much slower than in Cl adlayers on Cu(1 0 0). The increase in defect density observed toward more positive potentials suggests a change of the adsorbate–adsorbate interactions with potential
Availability note (English)
Available from http://dx.doi.org/10.1016/j.electacta.2013.01.160Additional details
Identifiers
- DOI
- 10.1016/j.electacta.2013.01.160;
- PII
- S0013-4686(13)00246-6;
Publishing Information
- Journal Title
- Electrochimica Acta
- Journal Volume
- 112
- Journal Page Range
- p. 881-886
- ISSN
- 0013-4686
- CODEN
- ELCAAV
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45055347
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ADSORPTION; ANIONS; DENSITY; INTERACTIONS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; SURFACES
- Descriptors DEC
- CHARGED PARTICLES; IONS; MICROSCOPY; PHYSICAL PROPERTIES; SORPTION
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.