Published May 25, 2003 | Version v1
Journal article

In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

Creators

Description

Pb(Mg1/3Nb2/3)O3-PbTiO3 (PMN-PT) single crystals exhibit ultrahigh piezoelectric coefficients and are the most promising candidates for the next generation of transducers, sensors and actuators. One critical problem that limits the device performance using these crystals is the fatigue degradation associated with the electric cycling. Microcracking is the most serious degradation phenomenon in these piezoelectric materials. In this work, in situ transmission electron microscopy (TEM) was used to investigate electric field-induced microcracking in PMN-PT single crystals. Microcrack initiation from a fine pore under a cyclic field and field-induced ferroelectric domain boundary cracking were directly observed in the piezoelectric single crystals

Additional details

Identifiers

DOI
10.1016/S0921-5107(02)00430-0;
arXiv
arXiv:cond-mat/0006149v1;
PII
S0921510702004300;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
99
Journal Issue
1-3
Journal Page Range
p. 106-111
ISSN
0921-5107
CODEN
MSBTEK

Conference

Title
8. IUMRS international conference on electronic materials
Acronym
IUMRS-ICEM2002 - Symposium N
Dates
10-14 Jun 2002
Place
Xi'an (China)

Optional Information

Copyright
Copyright (c) 2002 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.