Published March 2013 | Version v1
Journal article

Fabrication and characteristics of magnetic field sensors based on nano-polysilicon thin-film transistors

  • 1. Key Laboratory of Electronics Engineering, College of Heilongjiang Province, Heilongjiang University, Harbin 150080 (China)

Description

A magnetic field sensor based on nano-polysilicon thin films transistors (TFTs) with Hall probes is proposed. The magnetic field sensors are fabricated on 〈100〉 orientation high resistivity (ρ > 500 Ω·cm) silicon substrates by using CMOS technology, which adopt nano-polysilicon thin films with thicknesses of 90 nm and heterojunction interfaces between the nano-polysilicon thin films and the high resistivity silicon substrates as the sensing layers. The experimental results show that when VDS = 5.0 V, the magnetic sensitivities of magnetic field sensors based on nano-polysilicon TFTs with length—width ratios of 160 μm/80 μm, 320 μm/80 μm and 480 μm/80 μm are 78 mV/T, 55 mV/T and 34 mV/T, respectively. Under the same conditions, the magnetic sensitivity of the obtained magnetic field sensor is significantly improved in comparison with a Hall magnetic field sensor adopting silicon as the sensing layers. (semiconductor technology)

Availability note (English)

Available from http://dx.doi.org/10.1088/1674-4926/34/3/036001

Additional details

Publishing Information

Journal Title
Journal of Semiconductors
Journal Volume
34
Journal Issue
3
Journal Page Range
[6 p.]
ISSN
1674-4926

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44061417
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
COMPARATIVE EVALUATIONS; FABRICATION; LAYERS; MAGNETIC FIELDS; PROBES; SEMICONDUCTOR MATERIALS; SENSITIVITY; SENSORS; SILICON; SUBSTRATES; THICKNESS; THIN FILMS; TRANSISTORS
Descriptors DEC
DIMENSIONS; ELEMENTS; EVALUATION; FILMS; MATERIALS; SEMICONDUCTOR DEVICES; SEMIMETALS