Published 1976 | Version v1
Book Metadata-only

Escape peak intensity corrections for Ge(Li) and NaI(Tl) radiation detectors

Creators

  • 1. Punjabi Univ., Patiala (India). Dept. of Physics

Description

Escape peak intensity corrections for Ge(Li) and NaI(Tl) radiation detectors have been calculated by using the most recent values of photoelectric absorption cross sections and fluorescence yields and compared with the existing data. While there is an agreement between the present and the earlier values for Ge(Li), the values for NaI(Tl) are found to be lower by 5 to 15%. (author)

Additional details

Publishing Information

Publisher
Department of Atomic Energy.
Imprint Place
Bombay
Imprint Title
Proceedings of the nuclear physics and solid state physics symposium, Calcutta, December 22-26, 1975
Imprint Pagination
p. 307.

Conference

Title
Nuclear physics and solid state physics symposium.
Dates
22 - 26 Dec 1975.
Place
Calcutta, India.

INIS

Country of Publication
India
Country of Input or Organization
India
INIS RN
8318838
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION; CORRECTIONS; CROSS SECTIONS; ESCAPE PEAKS; GAMMA RADIATION; LI-DRIFTED GE DETECTORS; PHOTOELECTRIC EFFECT; SCINTILLATION COUNTERS
Descriptors DEC
ELECTROMAGNETIC RADIATION; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; PEAKS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS