Position sensitive detector for fluorescence lifetime imaging
- 1. Leibniz Institute for Neurobiology, Magdeburg (Germany)
- 2. Institute of Molecular and Clinical Immunology, Otto von Guericke University, Magdeburg (Germany)
Description
We present a detector system with a microchannel plate based photomultiplier tube (MCP-PMT) and its application for fluorescence lifetime imaging (FLIM) in visible light. A capacity coupled imaging technique (charge image) combined with a charge division anode is employed for the positional readout. Using an artificial neural network's (ANN) computation model we are able to reconstruct the position of the incident photon as precise as 20 microns over the detector active area of 25 mm diameter. Thus, the resulting image quality corresponds roughly to a megapixel conventional CCD camera. Importantly, it is feasible to reach such resolution using only 9 charge acquisition channels supporting the anode structure of 14 interconnected readout electrodes. Additionally, the system features better than 50 ps temporal resolution allowing single photon counting FLIM acquisition with a regular fluorescence wide-field microscope
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/9/12/C12015Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 9
- Journal Issue
- 12
- Journal Page Range
- p. C12015
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46073276
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ANODES; CAMERAS; CAPACITY; CHARGE-COUPLED DEVICES; FLUORESCENCE; IMAGES; LIFETIME; MICROCHANNEL ELECTRON MULTIPLIERS; MICROSCOPES; NEURAL NETWORKS; PHOTONS; POSITION SENSITIVE DETECTORS; READOUT SYSTEMS; RESOLUTION
- Descriptors DEC
- BOSONS; ELECTRODES; ELECTRON MULTIPLIERS; ELECTRON TUBES; ELEMENTARY PARTICLES; EMISSION; LUMINESCENCE; MASSLESS PARTICLES; MEASURING INSTRUMENTS; PHOTON EMISSION; RADIATION DETECTORS; SEMICONDUCTOR DEVICES