Growth of semi-coherent Ni and NiO dual-phase nanoparticles using hollow cathode sputtering
- 1. Linkopings Universitet, Department of Physics, Chemistry and Biology (Sweden)
- 2. Tokyo Metropolitan University, Department of Intelligent Mechanical Systems (Japan)
Description
Anisotropic heterogenous Ni/NiO nanoparticles with controlled compositions are grown using a high-power pulsed hollow cathode process. These novel particles can be tuned to consist of single-phase Ni via two-phase Ni/NiO to fully oxidized NiO, with a size range of 5–25 nm for individual crystals. A novelty of this approach is the ability to assemble multiple particles of Ni and NiO into a single complex structure, increasing the Ni-NiO interface density. This type of particle growth is not seen before and is explained to be due to the fact that the process operates in a single-step approach, where both Ni and O can arrive at the formed nanoparticle nuclei and aid in the continuous particle growth. The finished particle will then be a consequence of the initially formed crystal, as well as the arrival rate ratio of the two species. These particles hold great potential for applications in fields, such as electro- and photocatalysis, where the ability to control the level of oxidation and/or interface density is of great importance.
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Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 21
- Journal Issue
- 2
- Journal Page Range
- p. 1-8
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51078858
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Descriptors DEI
- CATHODE SPUTTERING; CRYSTALS; HOLLOW CATHODES; INTERFACES; NANOPARTICLES; NICKEL OXIDES; OXIDATION; PHOTOCATALYSIS
- Descriptors DEC
- CATALYSIS; CATHODES; CHALCOGENIDES; CHEMICAL REACTIONS; ELECTRODES; NICKEL COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; PARTICLES; SPUTTERING; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2019 The Author(s)