Development of a Scanning X-ray Fluorescence Microscope Using Size-Controllable Focused X-ray Beam from 50 to 1500nm
Creators
- 1. Department of Precision Science and Technology, Graduate School of Engineering, Osaka University, Yamada-oka 2-1, Suita, Osaka 565-0871 (Japan)
- 2. Research Center for Ultra-Precision Science and Technology, Graduate School of Engineering, Osaka University, Yamada-oka 2-1, Suita, Osaka 565-0871 (Japan)
- 3. SPring-8/RIKEN, Kouto 1-1-1, Mikazuki, Hyogo 679-5148 (Japan)
- 4. SPring-8/Japan Synchrotron Radiation Research Institute (JASRI), Kouto 1-1-1, Mikazuki, Hyogo 679-5148 (Japan)
Description
In scanning X-ray microscopy, focused beam intensity and size are very important from the viewpoints of improvements of various performances such as sensitivity and spatial resolution. The K-B mirror optical system is considered to be the most promising method for hard X-ray focusing, allowing highly efficient and energy-tunable focusing. We developed focusing optical system using K-B mirrors where the focused beam size is controllable within the range of 50 - 1500 nm. The focused beam size and beam intensity can be adjusted by changing the source size, although beam intensity and size are in a trade-off relationship. This controllability provides convenience for microscopy application. Diffraction limited focal size is also achieved by setting the source size to 10 μm. Intracellular elemental mappings at the single-cell level were performed to demonstrate the performance of the scanning X-ray fluorescence microscope equipped with the optical system at the BL29XUL of SPring-8. We will show magnified elemental images with spatial resolution of ∼70 nm
Additional details
Identifiers
- DOI
- 10.1063/1.2436308;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 879
- Journal Issue
- 1
- Journal Page Range
- p. 1325-1328
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 9. international conference on synchrotron radiation instrumentation
- Dates
- 28 May - 2 Jun 2006
- Place
- Daegu (Korea, Republic of)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39061382
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BEAM OPTICS; FLUORESCENCE; FOCUSING; HARD X RADIATION; IMAGES; MAPPING; MICROSCOPY; MIRRORS; OPTICAL SYSTEMS; PERFORMANCE; SENSITIVITY; SPATIAL RESOLUTION; SPRING-8 STORAGE RING; X-RAY DIFFRACTION; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- CHEMICAL ANALYSIS; COHERENT SCATTERING; DIFFRACTION; ELECTROMAGNETIC RADIATION; EMISSION; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATION SOURCES; RADIATIONS; RESOLUTION; SCATTERING; STORAGE RINGS; SYNCHROTRON RADIATION SOURCES; X RADIATION; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- (c) 2007 American Institute of Physics