Published 1987
| Version v1
Book
Principles and applications of high-energy ion microbeams
Description
The book concerns the techniques of high-energy ion beam microanalysis, and reviews the principles and applications of the technique. The contents include a historical review of the subject, and a description of the physical principles behind the analytical techniques in common use, namely particle-induced X-ray emission, Rutherford back-scattering and nuclear reaction analysis. The principles underlying the production of a focused beam of high-speed heavy particles are described, along with the practical problems of building a microprobe. Previous and potential applications of ion microbeams in biology, medicine, earth sciences, metallurgy and industry, solid state physics and electronics, and archaeology are also discussed. (UK)
Additional details
Publishing Information
- Publisher
- Adam Hilger.
- Imprint Place
- Bristol (UK)
- Imprint Pagination
- 413 p.
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 19057686
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- CHEMICAL ANALYSIS; ION BEAMS; ION MICROPROBE ANALYSIS; MICROANALYSIS; NONDESTRUCTIVE ANALYSIS; NUCLEAR REACTION ANALYSIS; PIXE ANALYSIS; REVIEWS; RUTHERFORD SCATTERING; USES
- Descriptors DEC
- BEAMS; DOCUMENT TYPES; ELASTIC SCATTERING; SCATTERING; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- Price Pound 69.50.