A miniature EBIT with ion extraction for isolating highly charged ions
Creators
- 1. National Institute of Standards and Technology, Gaithersburg, MD 20899 (United States)
Description
A room-temperature miniature electron beam ion trap (EBIT) is being developed for the production of charge states with a relatively low ionization threshold. A unitary Penning trap is modified slightly to provide the magnetic field and electric potential necessary for ion production via electron impact in this compact EBIT. This design allows radial access for in- EBIT spectroscopy as well as extraction of highly-charged ions for isolation at low energy to investigate proposed experiments. A fast micro-channel plate is used as a time-of-flight detector to study the initial production of helium and neon ions. Planned work would also involve the use of a Wien filter to select a single charge state to be isolated in a secondary ion trap for various studies. For instance, fully stripped ions can be captured for recombination experiments to form one-electron ions in high-angular momentum Rydberg states
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/583/1/012044Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 583
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 17. International Conference on the Physics of Highly Charged Ions
- Dates
- 31 Aug - 5 Sep 2014
- Place
- San Carlos de Bariloche (Argentina)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47029174
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANGULAR MOMENTUM; CAPTURE; CHARGE STATES; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON SPECTROSCOPY; ELECTRON-ATOM COLLISIONS; ELECTRONS; HELIUM; HELIUM IONS; MAGNETIC FIELDS; MICROCHANNEL ELECTRON MULTIPLIERS; MULTICHARGED IONS; NEON IONS; RECOMBINATION; RYDBERG STATES; TIME-OF-FLIGHT METHOD; TRAPS
- Descriptors DEC
- ATOM COLLISIONS; BEAMS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELECTRON MULTIPLIERS; ELECTRON TUBES; ELEMENTARY PARTICLES; ELEMENTS; ENERGY LEVELS; EXCITED STATES; FERMIONS; FLUIDS; GASES; IONS; LEPTON BEAMS; LEPTONS; NONMETALS; PARTICLE BEAMS; RARE GASES; SPECTROSCOPY