High-sensitivity gamma-ray counting in activation analysis
Creators
- 1. National Inst. of Standards and Technology, Gaithersburg, MD (United States). Inorganic Analytical Research Div.
Description
In activation analysis, optimizing counting conditions can generally improve precision or increase the number of samples that can be counted, or both. Much is gained in sensitivity by using high-efficiency detectors. With care in selection of detector and shield materials, the only important source of environmental gamma-ray background is the interactions of cosmic-ray particles with the shield and the detector itself. Application of Cooper's criterion to two excellent modern detectors shows that for the ultimate sensitivity in quantitating a simple spectrum, high efficiency overwhelms good resolution, low background, or any other criterion of detector quality in the choice of detectors for a given measurement. In practice, the choice is not so simple when summing corrections are large, when multiplets are present which the detector cannot fully resolve, when the total count rate is high, when background peaks (not continuum) are important, when positioning uncertainty limits the accuracy, or when requirements of sample shape dictate the counting configuration. (author)
Additional details
Publishing Information
- Journal Title
- Applied Radiation and Isotopes
- Journal Volume
- 43
- Journal Issue
- 1-2
- Series
- Appl. Radiat. Isot.
- Journal Page Range
- 263-269
- ISSN
- 0883-2889
- CODEN
- ARISE
Conference
- Title
- ICRM symposium of low-level-radioactivity measuring techniques and alpha-particle spectrometry.
- Dates
- 4-7 Jun 1991.
- Place
- Monaco (Monaco).
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 23021191
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCURACY; BACKGROUND RADIATION; COUNTING RATES; EVALUATION; HIGH-PURITY GE DETECTORS; NEUTRON ACTIVATION ANALYSIS; OPTIMIZATION; SENSITIVITY
- Descriptors DEC
- ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS