Published October 7, 2002 | Version v1
Journal article Metadata-only

Scattering theory of interface resistance in magnetic multilayers

Creators

  • 1. Department of Applied Physics and DIMES, Delft University of Technology, Delft (Netherlands)
  • 2. Philips Research, Eindhoven (Netherlands)
  • 3. Faculty of Applied Physics and MESA Research Institute, University of Twente, Enschede (Netherlands)

Description

The scattering theory of transport has to be applied with care in a diffuse environment. Here, we discuss how the scattering matrices of heterointerfaces can be used to compute interface resistances of dirty magnetic multilayers. First-principles calculations of these interface resistances agree well with experiments in the current perpendicular to the interface plane configuration. (author)

Availability note (English)

Available online at the Web site for the Journal of Physics. D, Applied Physics (ISSN 1361-6463) http://www.iop.org/

Additional details

Identifiers

URL
http://www.iop.org/;
DOI
10.1088/0022-3727/35/19/313;
PII
S0022-3727(02)35771-1;

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
35
Journal Issue
19
Journal Page Range
p. 2410-2414
ISSN
0022-3727

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
33048455
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ELECTRIC CONDUCTIVITY; ELECTRIC CURRENTS; INTERFACES; LAYERS; MAGNETIC MATERIALS; SCATTERING
Descriptors DEC
CURRENTS; ELECTRICAL PROPERTIES; MATERIALS; PHYSICAL PROPERTIES