The effects of amorphous Al2O3 underlayer on the microstructure and magnetic properties of BaFe12O19 thin films

Single phase nanostructured BaFe12O19 thin films have been deposited on Si(110) substrate and Si(110) substrate with amorphous Al2O3 underlayer by a sol–gel method. The effects of the amorphous Al2O3 underlayer on the composition, microstructure and magnetic properties were explored by X-ray diffraction, scanning electron microscopy and vibrating sample magnetometery techniques. The results revealed that the amorphous Al2O3 underlayer promoted some perpendicular c-axis orientation with ΔHc=Hcperpendicular−Hc∥=300 Oe. - Highlights: • The BaFe12O19 film fabricated by the Pechini method, deposited on Si(110), Si(110)/Al2O3 substrates. • The Al2O3 underlayer induced some c-axis perpendicular orientation. • Out-of-plane magnetic properties of the film with underlayer are better than those of in-plane orientation