Published 1977
| Version v1
Book
X-ray microanalysis in the electron microscope
Description
The combination of electron-optical imaging and X-ray analysis, i.e. X-ray microanalysis is used in diverse scientific areas. Instruments and techniques involved in the analysis of relatively thin specimens are described. Application in both the transmission and scanning electron microscopes is discussed. Emphasis is placed on practical aspects of analysis. Only well-established techniques which have been successfully used outside their laboratory of origin are included
Additional details
Publishing Information
- Publisher
- North-Holland.
- Imprint Place
- Amsterdam, Netherlands
- ISBN
- 0 7204 0607 2
- Imprint Pagination
- 231 p.
- Journal Volume
- 5, pt. 2
- Series
- Practical Methods in Electron Microscopy.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 8335357
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
- Descriptors DEI
- ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; SAMPLE PREPARATION; X-RAY DETECTION; X-RAY EQUIPMENT; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- CHEMICAL ANALYSIS; MICROSCOPES; MICROSCOPY; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTION; SPECTROSCOPY; X-RAY EMISSION ANALYSIS