Published November 1999
| Version v1
Journal article
Normal-metal hot-electron microbolometer with on-chip protection by tunnel junctions
Creators
- 1. Department of Microelectronics and Nanoscience, Chalmers University of Technology, S-412 96 Gothenburg (Sweden)
Description
We describe recent developments in a fully on-chip integrated antenna-coupled bolometer for astrophysical applications at millimetre and submillimetre wavelengths. We have developed a normal-metal hot-electron microbolometer with Andreev mirrors for thermal protection of the absorber and the coupling to the antenna. In previous experiments we could not operate the sensor at temperatures below 300 mK presumably because of the high external noise load. Our latest results with the absorber protected by tunnel junctions show how this problem can be solved experimentally. We have achieved noise performance mostly limited by the amplifier, which corresponds to expected detector NEP on the order of 1.5x10-17 W Hz1/2 at 100 mK. (author)
Additional details
Publishing Information
- Journal Title
- Superconductor Science and Technology (Online)
- Journal Volume
- 12
- Journal Issue
- 11
- Journal Page Range
- p. 985-988
- ISSN
- 1361-6668
Conference
- Title
- International superconductive electronics conference
- Dates
- 21-25 Jun 1999
- Place
- Berkeley, CA (United States)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- Uzbekistan
- INIS RN
- 31041629
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND NOISE; BOLOMETERS; JOSEPHSON JUNCTIONS; MICROWAVE EQUIPMENT; MICROWAVE RADIATION; PERFORMANCE TESTING; TEMPERATURE MEASUREMENT
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; MEASURING INSTRUMENTS; NOISE; RADIATIONS; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTING JUNCTIONS; TESTING