X-ray photoelectron spectroscopy study of MBE-grown Gd/EuTe multilayers
Creators
- 1. Semiconductor Physics Institute, A. Gostauto Street 11, 01108 Vilnius (Lithuania)
- 2. Institute of Physics, Polish Academy of Sciences, Al. Lotnikow 32/46, 02-668 Warsaw (Poland)
- 3. Institute of Physical Electronics of Kaunas University of Technology, Savanoriu 271, LT-3031Kaunas (Lithuania)
Description
Photoelectron spectroscopy has been used to study the Gd/EuTe multilayers structure covered with a thin (100 A) Al film. The study of the main core level and valence band photoemission spectra has shown no interaction between Gd and EuTe layers. Gadolinium was in pure metallic state and the ions of Eu were found divalent in the Gd/EuTe multilayers structure. The europium ions spectra analysis indicates that Ar+ ion sputtering of the sample surface leads to a deviation from stoichiometry in the near surface region of the EuTe layers and to the appearance of Eu3+ species in uppermost layers of the Gd/EuTe multilayers structure. The long-time exposure to the XPS ambient gases has been characterized from the analysis of europium 3d core level spectra
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2005.03.083;
- PII
- S0925-8388(05)00378-6;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 401
- Journal Issue
- 1-2
- Journal Page Range
- p. 150-154
- ISSN
- 0925-8388
- CODEN
- JALCEU
Conference
- Title
- International conference on experimental and computing methods in high resolution diffraction applied for structure characterization of modern materials
- Acronym
- 7. international school and symposium on synchrotron radiation in natural science; HREDAMM 2004
- Dates
- 13-17 Jun 2004
- Place
- Zakopane (Poland)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37093684
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; CRYSTAL GROWTH; EUROPIUM IONS; EUROPIUM TELLURIDES; FILMS; GADOLINIUM; INTERFACES; LAYERS; MOLECULAR BEAM EPITAXY; PHOTOEMISSION; SPECTRA; SPUTTERING; SURFACES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; CRYSTAL GROWTH METHODS; ELECTRON SPECTROSCOPY; ELEMENTS; EMISSION; EPITAXY; EUROPIUM COMPOUNDS; IONS; METALS; PHOTOELECTRON SPECTROSCOPY; RARE EARTH COMPOUNDS; RARE EARTHS; SECONDARY EMISSION; SPECTROSCOPY; TELLURIDES; TELLURIUM COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.