Published March 10, 2003 | Version v1
Journal article Metadata-only

Point x-ray source using graphite nanofibers and its application to x-ray radiography

Creators

  • 1. Research Institute of Electrical Communication, Tohoku University, 2-1-1 Katahira, Aoba, Sendai 980-8577 (Japan)
  • 2. Research and Development Center, Stanley Electric Corporation, 1-3-1 Eda-Nishi, Aoba, Yokohama 225-0014 (Japan)

Description

A point x-ray emission was obtained from a diode configuration composed of a graphite-nanofiber cold cathode and a conical-shaped copper metal anode. When combined with a highly sensitive charge coupled device (CCD) camera with a scintillator, this x-ray source was then used to obtain x-ray transmission images of a tungsten mesh and an x-ray test chart. The spatial resolution of this x-ray radiography system was on the order of 10 μm and the acquisition time for these images was less than 10 s. This combination of the point x-ray source and the sensitive detection system offers a high-resolution x-ray radiography system

Additional details

Identifiers

DOI
10.1063/1.1558969;

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
82
Journal Issue
10
Journal Page Range
p. 1637-1639
ISSN
0003-6951
CODEN
APPLAB

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35032372
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Numerical Data
Descriptors DEI
CARBON FIBERS; CATHODES; CHARGE-COUPLED DEVICES; EMISSION; EXPERIMENTAL DATA; GRAPHITE; NANOSTRUCTURES; X RADIATION; X-RAY RADIOGRAPHY
Descriptors DEC
CARBON; DATA; ELECTRODES; ELECTROMAGNETIC RADIATION; ELEMENTS; FIBERS; INDUSTRIAL RADIOGRAPHY; INFORMATION; IONIZING RADIATIONS; MATERIALS TESTING; MINERALS; NONDESTRUCTIVE TESTING; NONMETALS; NUMERICAL DATA; RADIATIONS; SEMICONDUCTOR DEVICES; TESTING

Optional Information

Notes
(c) 2003 American Institute of Physics.