Published April 2012 | Version v1
Journal article Metadata-only

Characterization of shear bands/cracks induced by fatigue experiment in a Zr–Cu–Al bulk metallic glass

Creators

  • 1. Department of Materials Science and Engineering, Feng Chia University, Taichung 40724, Taiwan (China)
  • 2. Department of Materials Science and Engineering, The University of Tennessee, Knoxville, TN 37996 (United States)

Description

A Zr50Cu40Al10 bulk metallic glass was deformed by three-point bending fatigue experiments. Shear bands/cracks appeared on the tensile and compressive regions of the sample surfaces. Characterizations of these shear bands/cracks cross sections by transmission electron microscopy reveal that a composition change occurred within the shear bands/cracks. Additionally, nanocrystallites with a higher copper content formed within the cracks. The composition change of the shear bands/cracks and formation of nanocrystallites are attributed to the diffusion of oxygen and copper atoms, respectively.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2011.12.009

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2011.12.009;
PII
S1359-6462(11)00747-0;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
66
Journal Issue
7
Journal Page Range
p. 443-446
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45024837
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ALUMINIUM ALLOYS; BENDING; COPPER; COPPER ALLOYS; CRACKS; CRYSTALS; DIFFUSION; FATIGUE; METALLIC GLASSES; OXYGEN; SHEAR PROPERTIES; SURFACES; TRANSMISSION ELECTRON MICROSCOPY; ZIRCONIUM BASE ALLOYS
Descriptors DEC
ALLOYS; DEFORMATION; ELECTRON MICROSCOPY; ELEMENTS; MECHANICAL PROPERTIES; METALS; MICROSCOPY; NONMETALS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENTS; ZIRCONIUM ALLOYS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.