Meeting the needs of process analytical chemistry with XRF analysis

X-ray fluorescence spectroscopy (XRF) analysis is an analytical technique which allows for both qualitative and quantitative analysis of samples. The X-Met 820 bench-top and 880 portable XRF analysers are considered to be ideal instruments for process control analysis. They use high resolution proportional detectors and isotope sources. This allows to analyse all elements with ppm detection limits. The severe overlaps and interelement effects found in samples could be easily handled. The data presented demonstrates the performance of the X-Met, in analysing samples of Ni ore for Ni, Fe, Co and Cu. A single 200 second reading analysed all elements. The auto normalization and gain control features make sure that the instrument is all ready and self calibrated without any intervention by the operator. 1 tab., ill