Reduction process of RuO2 powders and kinetics of their re-oxidation
Creators
Description
With the aim of improving knowledge of the phenomena occurring during the development of thick film resistors (TFRs), redox reactions were studied in fine powders of Ru and RuO2 by means of thermogravimetric analyses and X ray diffraction as well as observations in scanning electron microscope and X-ray fluorescence. Reduction of RuO2 powders by forming gas (10% H2 in N2) occurs in a few minutes, after an induction period, at temperatures as low as ∼100 deg. C, at a rate essentially independent of temperature (50-150 deg. C) and grain size. The oxidation process is well described by the Avrami model, according to a diffusion limited reaction with an apparent activation energy of 1.5±0.1 eV and it requires long times for completion even at relative high temperatures (700-850 deg. C). The order of magnitude for the diffusivity of the mobile species was derived. In addition, the reduction and further re-oxidation of RuO2 powders blended with ethyl cellulose were studied. Possible implications of the results on the properties of RuO2-based TFRs are discussed
Additional details
Identifiers
- DOI
- 10.1016/S0921-5107;
- PII
- S0921510703000497;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 98
- Journal Issue
- 2
- Journal Page Range
- p. 167-176
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37046185
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ACTIVATION ENERGY; DIFFUSION; EV RANGE; FILMS; FLUORESCENCE; GRAIN SIZE; HYDROGEN; KINETICS; OXIDATION; PHASE TRANSFORMATIONS; POWDERS; REDOX REACTIONS; REDUCTION; RESISTORS; RUTHENIUM OXIDES; SCANNING ELECTRON MICROSCOPY; THERMAL GRAVIMETRIC ANALYSIS; X-RAY DIFFRACTION
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; CHEMICAL REACTIONS; COHERENT SCATTERING; DIFFRACTION; ELECTRICAL EQUIPMENT; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; ENERGY; ENERGY RANGE; EQUIPMENT; GRAVIMETRIC ANALYSIS; LUMINESCENCE; MICROSCOPY; MICROSTRUCTURE; NONMETALS; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION; QUANTITATIVE CHEMICAL ANALYSIS; REFRACTORY METAL COMPOUNDS; RUTHENIUM COMPOUNDS; SCATTERING; SIZE; THERMAL ANALYSIS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.