ANDEN: A new tool for modeling Grazing Incidence X-ray Fluorescence (GI-XRF) in stratified samples

A Graphical User Interface (GUI), written in Python, has been developed for simulating Grazing Incidence X-Ray Fluorescence (GI-XRF) data for layered thin films. Perfectly sharp, as well as rough interfaces can be included in the simulation. The code also considers enhancement effects due to an inter-element secondary excitation inside the sample. Initial tests showed the simulations from well-known thin films (standards) are in good agreement with experimental data. In this work, we focus on the study of diluted magnetic semiconductors (DMS) where a semiconductor oxide is doped with a metal ion. Simulations of Co-doped SnO₂ thin films deposited on LaAlO₃ (LAO) were performed in order to study thickness-dependent distribution of Co metal ions. (author)