Published June 2011 | Version v1
Journal article Metadata-only

Wettability of Ni-Cr filler on SiC ceramic and interfacial reactions for the SiC/Ni-51Cr system

Creators

  • 1. Department of Materials Science and Chemical Engineering, Politecnico di Torino, Torino 10129 (Italy)

Description

Highlights: → The chromium addition remarkably improves the wettability of SiC/Ni-Cr systems. → The interfacial reactions are investigated for the SiC/Ni-51Cr system. → The factors affecting the wettability of SiC/Ni-Cr systems are discussed. -- The chromium addition remarkably improves the wettability of SiC/Ni-Cr systems within the Cr content range of 10-60 wt.%. For the SiC/Ni-51Cr system, a reaction layer about 100 μm thick exists between the SiC ceramic and the filler layer and is composed mainly of Ni2Si and graphite with a little Cr23C6, whereas the filler layer consists mainly of Cr23C6 and Ni2Si. Both the interfacial reactions and the formation of reaction products contribute to the improvement of the wetting of SiC/Ni-Cr systems.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.scriptamat.2011.02.027

Additional details

Identifiers

DOI
10.1016/j.scriptamat.2011.02.027;
PII
S1359-6462(11)00106-0;

Publishing Information

Journal Title
Scripta Materialia
Journal Volume
64
Journal Issue
12
Journal Page Range
p. 1087-1090
ISSN
1359-6462
CODEN
SCMAF7

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45024458
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CERAMICS; CHROMIUM; CHROMIUM ADDITIONS; CHROMIUM CARBIDES; FILLERS; GRAPHITE; INTERFACES; LAYERS; MICROSTRUCTURE; NICKEL; NICKEL SILICIDES; SILICON CARBIDES; WETTABILITY
Descriptors DEC
ALLOYS; CARBIDES; CARBON; CARBON COMPOUNDS; CHROMIUM ALLOYS; CHROMIUM COMPOUNDS; ELEMENTS; METALS; MINERALS; NICKEL COMPOUNDS; NONMETALS; SILICIDES; SILICON COMPOUNDS; TRANSITION ELEMENT ALLOYS; TRANSITION ELEMENT COMPOUNDS; TRANSITION ELEMENTS

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.