Published May 28, 2000 | Version v1
Journal article

Research and application of the ECR ion source

  • 1. Hungarian Academy of Sciences, Debrecen (Hungary). Inst. of Nuclear Research

Description

Complete text of publication follows. Instrument and beam development. The magnetic mirror ratio of the ECR Ion Source was increased from 1.8 to 2.2 at the injection side. The length of the plasma chamber (and thus, the plasma volume) has been optimized and the vacuum pumping efficiency was increased. Using a simulation software the extraction optics system has been improved. The water cooling system was modified and now it can be operated at any weather conditions. All these developments resulted in an increase of the heavy ion beam currents by a factor of 1.5/10. Figure 1 shows the highest beam currents obtained from the ATOMKI-ECRIS so far. Most extractions were carried out at 10 kV platform potential. Plasma research. Two accompanying papers [1] describe some results on plasma physics research carried out in our lab in 1999. A new project (implantation of N ions into fullerene molecules) will start in 2000. Material research with highly charged heavy ions. At the Frankfurt ECR-RFQ complex. Ar ions with energies of 6/8 MeV and with charge states of 8, 12 and higher were used to irradiate thin (1-2 micrometer) Si crystals. By measuring the transmitted and post-accelerated particles we investigated the modification in average charge state and charge state distribution after passing through the sample. We continued our other collaborations with foreign ECR groups. Promising experiments were carried out in the NIRS institute (Japan) while for the PSI (Switzerland) pionic hydrogen project an ECR Ion Trap was designed. New results are expected in 2000. (author)

Additional details

Publishing Information

Journal Title
ATOMKI Annual Report
Journal Issue
no.13
Journal Page Range
p. 74
ISSN
0231-3596
CODEN
AREAE9

INIS

Country of Publication
Hungary
Country of Input or Organization
Hungary
INIS RN
31041823
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
BEAM CURRENTS; BEAM EXTRACTION; ECR ION SOURCES; HEAVY ION REACTIONS; MAGNETIC MIRRORS; PLASMA
Descriptors DEC
CHARGED-PARTICLE REACTIONS; CURRENTS; ION SOURCES; NUCLEAR REACTIONS; OPEN PLASMA DEVICES; THERMONUCLEAR DEVICES

Optional Information

Notes
1 ref.