Expectation propagation for nonlinear inverse problems – with an application to electrical impedance tomography
Creators
- 1. Center for Industrial Mathematics, University of Bremen, Bremen D-28344 (Germany)
- 2. Department of Mathematics, University of California, Riverside, University Ave. 900, Riverside, CA 92521 (United States)
Description
In this paper, we study a fast approximate inference method based on expectation propagation for exploring the posterior probability distribution arising from the Bayesian formulation of nonlinear inverse problems. It is capable of efficiently delivering reliable estimates of the posterior mean and covariance, thereby providing an inverse solution together with quantified uncertainties. Some theoretical properties of the iterative algorithm are discussed, and the efficient implementation for an important class of problems of projection type is described. The method is illustrated with one typical nonlinear inverse problem, electrical impedance tomography with complete electrode model, under sparsity constraints. Numerical results for real experimental data are presented, and compared with that by Markov chain Monte Carlo. The results indicate that the method is accurate and computationally very efficient
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jcp.2013.12.010Additional details
Identifiers
- DOI
- 10.1016/j.jcp.2013.12.010;
- arXiv
- arXiv:1312.3378v1;
- PII
- S0021-9991(13)00809-7;
Publishing Information
- Journal Title
- Journal of Computational Physics
- Journal Volume
- 259
- Journal Page Range
- p. 513-535
- ISSN
- 0021-9991
- CODEN
- JCTPAH
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45051956
- Subject category
- S97: MATHEMATICAL METHODS AND COMPUTING;
- Descriptors DEI
- ALGORITHMS; APPROXIMATIONS; ELECTRODES; IMPEDANCE; ITERATIVE METHODS; MARKOV PROCESS; MATHEMATICAL SOLUTIONS; MONTE CARLO METHOD; NONLINEAR PROBLEMS; TOMOGRAPHY
- Descriptors DEC
- CALCULATION METHODS; DIAGNOSTIC TECHNIQUES; MATHEMATICAL LOGIC; STOCHASTIC PROCESSES
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.