Published February 15, 2014 | Version v1
Journal article

Expectation propagation for nonlinear inverse problems – with an application to electrical impedance tomography

  • 1. Center for Industrial Mathematics, University of Bremen, Bremen D-28344 (Germany)
  • 2. Department of Mathematics, University of California, Riverside, University Ave. 900, Riverside, CA 92521 (United States)

Description

In this paper, we study a fast approximate inference method based on expectation propagation for exploring the posterior probability distribution arising from the Bayesian formulation of nonlinear inverse problems. It is capable of efficiently delivering reliable estimates of the posterior mean and covariance, thereby providing an inverse solution together with quantified uncertainties. Some theoretical properties of the iterative algorithm are discussed, and the efficient implementation for an important class of problems of projection type is described. The method is illustrated with one typical nonlinear inverse problem, electrical impedance tomography with complete electrode model, under sparsity constraints. Numerical results for real experimental data are presented, and compared with that by Markov chain Monte Carlo. The results indicate that the method is accurate and computationally very efficient

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jcp.2013.12.010

Additional details

Identifiers

DOI
10.1016/j.jcp.2013.12.010;
arXiv
arXiv:1312.3378v1;
PII
S0021-9991(13)00809-7;

Publishing Information

Journal Title
Journal of Computational Physics
Journal Volume
259
Journal Page Range
p. 513-535
ISSN
0021-9991
CODEN
JCTPAH

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
45051956
Subject category
S97: MATHEMATICAL METHODS AND COMPUTING;
Descriptors DEI
ALGORITHMS; APPROXIMATIONS; ELECTRODES; IMPEDANCE; ITERATIVE METHODS; MARKOV PROCESS; MATHEMATICAL SOLUTIONS; MONTE CARLO METHOD; NONLINEAR PROBLEMS; TOMOGRAPHY
Descriptors DEC
CALCULATION METHODS; DIAGNOSTIC TECHNIQUES; MATHEMATICAL LOGIC; STOCHASTIC PROCESSES

Optional Information

Copyright
Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.