Development of the water window imaging x-ray microscope
- 1. Space Science Lab., Marshall Space Flight Center, AL (United States)
- 2. Dept. of Physics, Univ. of Alabama at Birmingham, Birmingham, AL (United States)
- 3. Baker Consulting, Walnut Creek, CA (United States)
- 4. Lawrence Livermore National Lab., Livermore, CA (United States)
- 5. Center for Space Science and Astrophysics, Stanford Univ., Stanford, CA (United States)
Description
This paper reports on the Water Window Imaging X-ray Microscopy which is currently being developed by a consortium from the Marshall Space Flight Center, the University of Alabama at Birmingham, Baker Consulting, the Lawrence Livermore National Laboratory, and Stanford University. The high quality solar images achieved during the Stanford/MSFC/LLNL Rocket X-ray Spectroheliograph flight conclusively established that excellent imaging could be obtained with doubly reflecting multilayer optical systems. Theoretical studies carried out as part of the MSFC X-ray Microscopy Program, demonstrated that high quality, high resolution multilayer x-ray imaging microscopes could be achieved with spherical optics in the Schwarzschild configuration and with Aspherical optical systems. Advanced Flow Polishing methods have been used to fabricate substrates for multilayer optics. On hemlite grade Sapphire, the authors have achieved microscopy mirror substrates on concave and convex spherical surfaces with 0.5 Angstrom rms surface smoothness, as measured by the Zygo profilometer. In this paper the authors report on the current status of fabrication and testing of the optical and mechanical subsystems for the Water Window Imaging X-ray Microscope
Additional details
Publishing Information
- Publisher
- SPIE Society of Photo-Optical Instrumentation Engineers.
- Imprint Place
- Bellingham, WA (United States)
- ISBN
- 0-8194-0525-6
- Imprint Title
- Optical methods for ultrasensitive detection and analysis: Techniques and applications
- Imprint Pagination
- 375 p.
- Journal Page Range
- p. 338-351.
Conference
- Title
- 4th Society of Photo-Optical Instrumentation Engineers (SPIE) international symposium.
- Acronym
- OE/LASE '91
- Dates
- 20-25 Jan 1991.
- Place
- Los Angeles, CA (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23068086
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DESIGN; FABRICATION; IMAGE PROCESSING; INDUSTRIAL RADIOGRAPHY; MICROSCOPES; OPERATION; OPTICAL SYSTEMS; SCHWARZSCHILD RADIUS; SOLAR SYSTEM; SUBSTRATES; X RADIATION; X-RAY EQUIPMENT; X-RAY SPECTROMETERS
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; EQUIPMENT; IONIZING RADIATIONS; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; RADIATIONS; SPECTROMETERS; TESTING
Optional Information
- Secondary number(s)
- CONF-910123--.