Determination of calibration line slopes in XRF analysis using one standard. Part I. Polychromatic excitation of K-series elements

An algorithm is described for the theoretical calculation of the slopes of calibration lines for the elements of the K-series in multi-element X-ray fluorescence analysis of powdered samples using polychromatic excitation. The mathematical equations used to calculate slopes as a function of atomic number are based on the fundamental relationship between fluorescent intensity and atomic number, fluorescent yield, concentration and mass absorption coefficients. A normalization procedure based on one known slope in the series ensured that the calculated slopes were correct for the particular matrix and measuring conditions. The method was applied to the analysis of powder samples using excitation by Mo, Au, W, and Cr X-ray tubes. (author). 8 refs., 3 tabs., 1 fig