Spray pyrolysis deposition of Cu3BiS3 thin films
Description
Wittichenite Cu3BiS3 semiconductor thin films were deposited on glass slides within a range in substrate temperature from 250 °C to 400 °C via spray pyrolysis approach. Effects of substrate temperature on crystal structure, surface morphology, and optical property of Cu3BiS3 films were investigated in details. Pictures from a scanning electron microscope revealed that the as-prepared films in polycrystalline nature were uniform and comprised of close-packed fine nanoparticles, which grew up greatly by increasing substrate temperature to 350 °C. The as-prepared Cu3BiS3 film exhibited a direct optical band gap between 1.65 eV and 1.72 eV. - Highlights: • Depositing wittichenite Cu3BiS3 thin films via spray pyrolysis • Polycrystalline Cu3BiS3 films were comprised of densely packed nanoparticles. • Direct optical band gaps of the films lie between 1.65 eV and 1.72 eV
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2015.04.025Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2015.04.025;
- PII
- S0040-6090(15)00370-3;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 585
- Journal Page Range
- p. 72-75
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47033386
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BISMUTH COMPOUNDS; COPPER COMPOUNDS; CRYSTAL STRUCTURE; DEPOSITION; GLASS; NANOPARTICLES; OPTICAL PROPERTIES; POLYCRYSTALS; PYROLYSIS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SOLAR ENERGY; SPRAYS; SUBSTRATES; SULFUR COMPOUNDS; SURFACES; TEMPERATURE RANGE 0400-1000 K; THIN FILMS
- Descriptors DEC
- CHEMICAL REACTIONS; CRYSTALS; DECOMPOSITION; ELECTRON MICROSCOPY; ENERGY; ENERGY SOURCES; FILMS; MATERIALS; MICROSCOPY; PARTICLES; PHYSICAL PROPERTIES; RENEWABLE ENERGY SOURCES; TEMPERATURE RANGE; THERMOCHEMICAL PROCESSES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.