Published March 6, 1980
| Version v1
Patent
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Measuring array for X-ray fluorescence analysis
Description
The sample is activated by X-rays from a X-ray emitting source and is then examined by spectrometry. The sample bearer is placed at a swinging frame so that the angle between sample and incoming beams can be adjusted. In order to exploit also the high energy part of the beams, a reflector for deflecting the beams is used, for example a plane-parallel plate of quartz. (DG)
Availability note (English)
MF available from INIS under the Report Number; Available from Deutsches Patentamt, Muenchen, Germany, F.R.Abstract (German)
Die Probe wird durch die von einer Roentgenstrahlen emittierenden Strahlenquelle streifend einfallende Roentgenstrahlung angeregt und spektrometrisch untersucht. Der Probentraeger befindet sich an einem schwenkbaren Rahmen, womit der Winkel von Probe zu einfallender Strahlung verstellbar ist. Um auch den hochenergetischen Teil der Strahlung ausnutzen zu koennen, wird noch ein die Strahlung umlenkender Reflektor, z.B. eine planparallele Platte aus Quarz, verwendet. (DG)Files
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Additional details
Additional titles
- Original title (German)
- Messanordnung zur Roentgenfluoreszenzanalyse
Publishing Information
- Imprint Pagination
- 5 p.
- Patent number
- DE patent document 2736960/C/
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 13651054
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BEAM OPTICS; MEASURING METHODS; QUARTZ; REFLECTION; X-RAY FLUORESCENCE ANALYSIS; X-RAY FLUORESCENCE ANALYZERS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL ANALYSIS; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; SILICON COMPOUNDS; SILICON OXIDES; X-RAY EMISSION ANALYSIS