Published November 24, 2003 | Version v1
Journal article

Physical and mechanical properties of reactively sputtered chromium boron nitride thin films

Description

This paper reports on the first study of physical and mechanical properties of reactively sputtered chromium boron nitride coatings as a function of chemical composition, bias voltage and substrate temperature. Several sets of coatings were deposited by reactive unbalanced magnetron sputtering on Si(100) substrates. The chemical composition was deduced from X-ray photoelectron spectroscopy and Auger electron spectroscopy measurements, and was found to be influenced primarily by nitrogen flow rate. The phase composition was determined using X-ray diffraction in conjunction with spectroscopic ellipsometry. Atomic force microscopy was utilized to determine surface roughness and average surface grain size. Both surface roughness and surface grain size were largely independent of the nitrogen concentration and decreased with increasing bias voltage. The nanohardness and elastic modulus of each sample were measured by nanoindentation. The hardest films were produced using -150 V bias voltage and either very low (0.5-1 sccm) or very high (12-15 sccm) nitrogen flow rates

Additional details

Identifiers

DOI
10.1016/S0040-6090;
PII
S0040609003011891;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
445
Journal Issue
1
Journal Page Range
p. 96-104
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.