Microscopy image segmentation tool: Robust image data analysis
- 1. Department of Physics and Center for Advanced Nanoscience, University of California San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)
Description
We present a software package called Microscopy Image Segmentation Tool (MIST). MIST is designed for analysis of microscopy images which contain large collections of small regions of interest (ROIs). Originally developed for analysis of porous anodic alumina scanning electron images, MIST capabilities have been expanded to allow use in a large variety of problems including analysis of biological tissue, inorganic and organic film grain structure, as well as nano- and meso-scopic structures. MIST provides a robust segmentation algorithm for the ROIs, includes many useful analysis capabilities, and is highly flexible allowing incorporation of specialized user developed analysis. We describe the unique advantages MIST has over existing analysis software. In addition, we present a number of diverse applications to scanning electron microscopy, atomic force microscopy, magnetic force microscopy, scanning tunneling microscopy, and fluorescent confocal laser scanning microscopy
Additional details
Identifiers
- DOI
- 10.1063/1.4866687;
Publishing Information
- Journal Title
- Review of Scientific Instruments
- Journal Volume
- 85
- Journal Issue
- 3
- Journal Page Range
- p. 033701-033701.6
- ISSN
- 0034-6748
- CODEN
- RSINAK
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45076228
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; ALUMINIUM OXIDES; ANIMAL TISSUES; ATOMIC FORCE MICROSCOPY; COMPUTER CODES; DATA ANALYSIS; ELECTRON SCANNING; FLUORESCENCE; IMAGES; MAGNETIC FIELDS; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BODY; CHALCOGENIDES; ELECTRON MICROSCOPY; EMISSION; LUMINESCENCE; MATERIALS; MATHEMATICAL LOGIC; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTON EMISSION
Optional Information
- Notes
- (c) 2014 AIP Publishing LLC