Published August 8, 2013
| Version v1
Journal article
Measurement of low radioactivity background in a high voltage cable by high resolution inductively coupled plasma mass spectrometry
Creators
- 1. Gran Sasso National Laboratory, Chemistry Service, SS 17bis km 18.910, 67100 Assergi (Aq) (Italy)
Description
The measurement of naturally occurring low level radioactivity background in a high voltage (HV) cable by high resolution inductively coupled plasma mass spectrometry (HR ICP MS) is presented in this work. The measurements were performed at the Chemistry Service of the Gran Sasso National Laboratory. The contributions to the radioactive background coming from the different components of the heterogeneous material were separated. Based on the mass fraction of the cable, the whole contamination was calculated. The HR ICP MS results were cross-checked by gamma ray spectroscopy analysis that was performed at the low background facility STELLA (Sub Terranean Low Level Assay) of the LNGS underground lab using HPGe detectors
Additional details
Identifiers
- DOI
- 10.1063/1.4818077;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1549
- Journal Issue
- 1
- Journal Page Range
- p. 66-69
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 4. international workshop on low radioactivity techniques
- Acronym
- LRT 2013
- Dates
- 10-12 Apr 2013
- Place
- Assergi (Italy)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45039166
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- BACKGROUND RADIATION; CABLES; ELECTRIC POTENTIAL; GAMMA SPECTROSCOPY; HIGH-PURITY GE DETECTORS; ICP MASS SPECTROSCOPY; MULTI-ELEMENT ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; RADIOACTIVITY; RESOLUTION; UNDERGROUND
- Descriptors DEC
- CHEMICAL ANALYSIS; GE SEMICONDUCTOR DETECTORS; LEVELS; MASS SPECTROSCOPY; MEASURING INSTRUMENTS; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY
Optional Information
- Notes
- (c) 2013 AIP Publishing LLC