Published October 1, 2011
| Version v1
Journal article
Simulation of defect evolution in electron-irradiated dilute FeCr alloys
- 1. Laboratorio Nacional de Fusion por Confinamiento Magnetico - CIEMAT, 28040 Madrid (Spain)
- 2. Institute of Nuclear Materials Science, SCK-CEN, Boeretang 200, B-2400 Mol (Belgium)
- 3. Department of Materials and Mechanics of Components, EDF R and D, F-77250 Moret-sur-Loing (France)
Description
A rate theory model based on ab initio data was used to predict defect evolution in electron-irradiated dilute FeCr alloys during isochronal annealing. A good correlation was found between the prediction of the model and existing isochronal resistivity recovery measurements. In agreement with experimental results, our model predicts a shift of stage IE towards lower temperature with increasing Cr concentration. According to our model, stage II is found to be not only due to the recombination of I2 clusters with vacancies but also due to the annihilation of ICr and I2Cr complexes at vacancies.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jnucmat.2010.12.188Additional details
Identifiers
- DOI
- 10.1016/j.jnucmat.2010.12.188;
- PII
- S0022-3115(10)01010-X;
Publishing Information
- Journal Title
- Journal of Nuclear Materials
- Journal Volume
- 417
- Journal Issue
- 1-3
- Journal Page Range
- p. 1078-1081
- ISSN
- 0022-3115
- CODEN
- JNUMAM
Conference
- Title
- 14. international conference on fusion reactor materials
- Acronym
- ICFRM-14
- Dates
- 7-12 Sep 2009
- Place
- Sapporo (Japan)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43059925
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOYS; ANNIHILATION; DEFECTS; ELECTRONS; IODINE; SIMULATION; VACANCIES
- Descriptors DEC
- CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HALOGENS; INTERACTIONS; LEPTONS; NONMETALS; PARTICLE INTERACTIONS; POINT DEFECTS
Optional Information
- Copyright
- Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.