Published October 1, 2011 | Version v1
Journal article

Simulation of defect evolution in electron-irradiated dilute FeCr alloys

  • 1. Laboratorio Nacional de Fusion por Confinamiento Magnetico - CIEMAT, 28040 Madrid (Spain)
  • 2. Institute of Nuclear Materials Science, SCK-CEN, Boeretang 200, B-2400 Mol (Belgium)
  • 3. Department of Materials and Mechanics of Components, EDF R and D, F-77250 Moret-sur-Loing (France)

Description

A rate theory model based on ab initio data was used to predict defect evolution in electron-irradiated dilute FeCr alloys during isochronal annealing. A good correlation was found between the prediction of the model and existing isochronal resistivity recovery measurements. In agreement with experimental results, our model predicts a shift of stage IE towards lower temperature with increasing Cr concentration. According to our model, stage II is found to be not only due to the recombination of I2 clusters with vacancies but also due to the annihilation of ICr and I2Cr complexes at vacancies.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.jnucmat.2010.12.188

Additional details

Identifiers

DOI
10.1016/j.jnucmat.2010.12.188;
PII
S0022-3115(10)01010-X;

Publishing Information

Journal Title
Journal of Nuclear Materials
Journal Volume
417
Journal Issue
1-3
Journal Page Range
p. 1078-1081
ISSN
0022-3115
CODEN
JNUMAM

Conference

Title
14. international conference on fusion reactor materials
Acronym
ICFRM-14
Dates
7-12 Sep 2009
Place
Sapporo (Japan)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
43059925
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; ANNIHILATION; DEFECTS; ELECTRONS; IODINE; SIMULATION; VACANCIES
Descriptors DEC
CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; HALOGENS; INTERACTIONS; LEPTONS; NONMETALS; PARTICLE INTERACTIONS; POINT DEFECTS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.