Effect of nitrogen doping on the structure of metastable β-W on SiO2
- 1. Imec, Kapeldreef 75, Leuven, 3001 (Belgium)
Description
Highlights: • Stabilization of β-W thin films by DC sputtering in Ar/N2 atmosphere • Increasing nitrogen content stabilizes the β phase but increase porosity • This has an impact on the perpendicular anisotropy of an adjacent CoFeB layer Metastable β-W phase exhibits a large spin Hall effect which has attracted a great interest for spin-orbit torque-based memory applications. Here we study the growth and structure of W films prepared by magnetron sputtering under different argon and nitrogen gas mixture conditions. X-ray diffraction and sheet resistivity show that low argon with low nitrogen gas flow stabilizes the β-W phase in thick films. High argon gas flow promotes the growth of porous β-W films which increases the oxygen content and the resistivity of the films. It is observed that the N2 doping of the W films reduce the perpendicular magnetic anisotropy of an adjacent CoFeB layer.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2021.138795Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2021.138795;
- PII
- S0040609021002789;
Publishing Information
- Journal Title
- Thin Solid Films (Print)
- Journal Volume
- 732
- Journal Page Range
- vp.
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 54007891
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANISOTROPY; ARGON; GAS FLOW; HALL EFFECT; L-S COUPLING; MAGNETRONS; POROSITY; POROUS MATERIALS; SHEETS; SPIN; SPUTTERING; STABILIZATION; THIN FILMS; TORQUE; TUNGSTEN; X-RAY DIFFRACTION
- Descriptors DEC
- ANGULAR MOMENTUM; COHERENT SCATTERING; COUPLING; DIFFRACTION; ELECTRON TUBES; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FILMS; FLUID FLOW; FLUIDS; GASES; INTERMEDIATE COUPLING; MATERIALS; METALS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; NONMETALS; PARTICLE PROPERTIES; RARE GASES; REFRACTORY METALS; SCATTERING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2021 Elsevier B.V. All rights reserved.