Published 1994
| Version v1
Book
Charged particle effects on optoelectronic devices and bit error rate measurements on 400 Mbps fiber based data links
Creators
- 1. Naval Research Lab., Washington, DC (United States)
- 2. National Aeronautics and Space Administration, Greenbelt, MD (United States). Lab. for High Energy Astrophysics
Description
Proton test results on a fiber optic data link operating at 400 megabits/s (Mbps) are described to elucidate the roles of important variables such as proton angle of entry and the optical signal strength. Interpretation of these data reveals that direct ionization events from protons can result in bit errors, though these effects can be mitigated with increased optical signal strength. We explore the consequences of these results to suggest single event tolerant approaches for satellite applications, and conclude that radiation tolerant links and busses can operate in even the most severe orbital environments with acceptable error rates of < 10-9. (author). 9 refs., 5 figs
Additional details
Publishing Information
- Publisher
- Commissariat a l'Energie Atomique.
- Imprint Place
- Bruyeres-le-Chatel (France)
- Imprint Title
- Radiation and its effects on components and systems
- Imprint Pagination
- 596 p.
- Journal Page Range
- p. 266-271.
Conference
- Title
- 2. European Conference on Radiation and its Effects on Components and Systems.
- Dates
- 13-16 Sep 1993.
- Place
- Saint-Malo (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 27008794
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CROSS SECTIONS; DATA TRANSMISSION SYSTEMS; DOSE RATES; ERRORS; GALLIUM ARSENIDES; INDIUM ARSENIDES; NASA; OPTICAL FIBERS; PHOTODIODES; PHYSICAL RADIATION EFFECTS; PROTON BEAMS
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BEAMS; FIBERS; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; NATIONAL ORGANIZATIONS; NUCLEON BEAMS; PARTICLE BEAMS; PNICTIDES; RADIATION EFFECTS; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; US ORGANIZATIONS