Published April 22, 2013 | Version v1
Journal article

Impact of the number of fitted Debye-Waller factors on EXAFS fitting

  • 1. Equipe SAX, ICMPE UMR7182 CNRS-UPEC, Thiais, 94320 (France)
  • 2. Departamento de Quimica Fisica, Universidad de Sevilla, Sevilla, 41012 (Spain)

Description

EXAFS fit applied to asymmetric systems may imply the fit of parameters for many scattering paths. We illustrate on some examples how fitting too many independent DWs may lead to incorrect distances and mask some structural details. We question the physical meaning of the fitted DW values and we propose some ideas to avoid this problem.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/430/1/012015

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
430
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
15. international conference on X-ray absorption fine structure
Acronym
XAFS15
Dates
22-28 Jul 2012
Place
Beijing (China)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44113779
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTROSCOPY; DEBYE-WALLER FACTOR; FINE STRUCTURE; SCATTERING; X-RAY SPECTROSCOPY
Descriptors DEC
SPECTROSCOPY