Published January 1, 2012
| Version v1
Journal article
Characterization of diamond films deposited on Re substrate by magnetic field-assisted hot filament chemical vapor deposition
- 1. School of Materials Science and Engineering Central South University, Changsha 410083 (China)
- 2. School of Metallurgy and Materials, University of Birmingham, Birmingham B15 2TT (United Kingdom)
Description
A periodically magnetic field (PMF) was used in a hot-filament chemical vapor deposited (HFCVD) for diamond growth on the rhenium substrate. The morphology, band structures and crystalline structure of the film were analyzed by the scanning electron microscopy (SEM), Raman spectroscopy and X-ray diffractometer (XRD), respectively. The results show that the thickness of the diamond film is about 2900 nm by 4 h deposition with magnetic field-assisted. There is no interlayer between diamond film and the rhenium substrate. The result shows that the turn on voltage of the sample is enhanced from 3.3 to 2.6 V/μm with the PMF. Also the total emission current density at 6.2 V/μm increased from 6.3 to 21.5 μA/cm2.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.apsusc.2011.03.131Additional details
Identifiers
- DOI
- 10.1016/j.apsusc.2011.03.131;
- PII
- S0169-4332(11)00495-8;
Publishing Information
- Journal Title
- Applied Surface Science
- Journal Volume
- 258
- Journal Issue
- 6
- Journal Page Range
- p. 2117-2120
- ISSN
- 0169-4332
- CODEN
- ASUSEE
Conference
- Title
- International vacuum congress
- Acronym
- IVC-18
- Dates
- 23-27 Aug 2010
- Place
- Beijing (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44031079
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; CURRENT DENSITY; DOPED MATERIALS; ELECTRON EMISSION; FIELD EMISSION; FILAMENTS; FILMS; MAGNETIC FIELDS; PERIODICITY; RAMAN SPECTROSCOPY; RHENIUM; SCANNING ELECTRON MICROSCOPY; SUBSTRATES; THICKNESS; X-RAY DIFFRACTION; X-RAY DIFFRACTOMETERS
- Descriptors DEC
- CHEMICAL COATING; COHERENT SCATTERING; DEPOSITION; DIFFRACTION; DIFFRACTOMETERS; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; EMISSION; LASER SPECTROSCOPY; MATERIALS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; REFRACTORY METALS; SCATTERING; SPECTROSCOPY; SURFACE COATING; TRANSITION ELEMENTS; VARIATIONS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.