Fluctuations analysis
Creators
- 1. California Univ., Berkeley (USA). Materials and Molecular Research Div.
- 2. California Univ., Berkeley (USA). Dept. of Physics
Description
This paper briefly reviews sources of noise in Josephson junctions, and the limits they impose on the sensitivity of dc and rf SQUIDS. The results are strictly valid only for a resistively shunted junction (RSJ) with zero capacitance, but should be applicable to point contact junctions and microbridges in so far as these devices can be approximated by the RSJ model. We first discuss fluctuations arising from Nyquist noise in the resistive shunt of a single junction in the limit eI0R/ksub(B)T << 1 in which a classical treatment is appropriate, and then extend the treatment to the limit eI0R/ksub(B)T >= 1 in which quantum effects become important. The Nyquist limit theory is used to calculate the noise in a dc SQUID, and the results are compared with a number of practical devices. The quantum limit is briefly considered. Results for the predicted sensitivity of rf SQUIDS are presented, and also compared with a number of practical devices. Finally, the importance of l/f noise (f is the frequency) in limiting the low frequency performance of SQUIDS is discussed. (orig.)
Additional details
Publishing Information
- Publisher
- de Gruyter.
- Imprint Place
- Berlin, Germany, F.R.
- ISBN
- 3-11-008063-X
- Imprint Title
- SQUID '80: Superconducting quantum interference devices and their applications
- Imprint Pagination
- 990 p.
- Journal Page Range
- p. 187-205.
Conference
- Title
- 2. international conference on superconducting quantum devices and 3. workshop on biomagnetism.
- Dates
- 6 - 9 May 1980.
- Place
- Berlin, Germany, F.R.
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 13665270
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTER CALCULATIONS; FLUCTUATIONS; JOSEPHSON JUNCTIONS; NOISE; RF SYSTEMS; SQUID DEVICES
- Descriptors DEC
- ELECTRONIC EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; MICROWAVE EQUIPMENT; SEMICONDUCTOR JUNCTIONS; SUPERCONDUCTING DEVICES; VARIATIONS