Measurement of the track etch rates along proton and alpha particle trajectories in CR-39 and calculation of the detection efficiency
Description
Computation of the neutron response of CR-39 detectors needs to simulate the track formation by neutron induced charged particles taking into account the bulk etch rate and the track etch rate varying along the particle trajectories. The latter one was determined experimentally by track length measurement. The results allowed to derive the relationship between the track etch rate and the restricted energy loss of the charged particles. On this basis, the geometrical track parameters and track etch rates as well as the critical angle of particle incidence could be determined for protons and alpha particles in the energy range from 0.2 to 8.8 MeV. The energy dependence of the critical angle enabled to determine the detection efficiency for a charged particle of given energy and direction
Additional details
Identifiers
- PII
- S1350448799001171;
Publishing Information
- Journal Title
- Radiation Measurements
- Journal Volume
- 31
- Journal Issue
- 1-6
- Journal Page Range
- p. 103-108
- ISSN
- 1350-4487
- CODEN
- RMEAEP
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 34017207
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S61: RADIATION PROTECTION AND DOSIMETRY;
- Descriptors DEI
- ALPHA DETECTION; ALPHA PARTICLES; COMPUTERIZED SIMULATION; DIELECTRIC TRACK DETECTORS; EFFICIENCY; ENERGY DEPENDENCE; ENERGY LOSSES; ETCHING; INCIDENCE ANGLE; KEV RANGE 100-1000; MEV RANGE 01-10; PARTICLE TRACKS; POLYCARBONATES; PROTON BEAMS; PROTON DETECTION; TRAJECTORIES
- Descriptors DEC
- BEAMS; CARBON COMPOUNDS; CARBONATES; CHARGED PARTICLE DETECTION; CHARGED PARTICLES; DETECTION; ENERGY RANGE; IONIZING RADIATIONS; KEV RANGE; LOSSES; MEASURING INSTRUMENTS; MEV RANGE; NUCLEON BEAMS; ORGANIC COMPOUNDS; ORGANIC POLYMERS; OXYGEN COMPOUNDS; PARTICLE BEAMS; POLYMERS; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SIMULATION; SURFACE FINISHING
Optional Information
- Copyright
- Copyright (c) 1999 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.