Published February 2011
| Version v1
Journal article
A novel structure in reducing the on-resistance of a VDMOS
Creators
- 1. Sichuan Institute of Solid-State Circuits, CETC, Chongqing 400060 (China)
Description
A novel structure of a VDMOS in reducing on-resistance is proposed. With this structure, the specific on-resistance value of the VDMOS is reduced by 22% of that of the traditional VDMOS structure as the breakdown voltage maintained the same value in theory, and there is only one additional mask in processing the new structure VDMOS, which is easily fabricated. With the TCAD tool, one 200 V N-channel VDMOS with the new structure is analyzed, and simulated results show that a specific on-resistance value will reduce by 23%, and the value by 33% will be realized when the device is fabricated in three epitaxies and four buried layers. The novel structure can be widely used in the strip-gate VDMOS area. (semiconductor devices)
Availability note (English)
Available from http://dx.doi.org/10.1088/1674-4926/32/2/024005Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Semiconductors
- Journal Volume
- 32
- Journal Issue
- 2
- Journal Page Range
- [4 p.]
- ISSN
- 1674-4926
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43013155
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- BREAKDOWN; ELECTRIC POTENTIAL; LAYERS; PROCESSING; SEMICONDUCTOR DEVICES; SIMULATION