Published November 21, 1988 | Version v1
Journal article

Radiation damage effects in ion-implanted Bi-Sr-Ca-Cu-O superconducting thin films

  • 1. NEC Corporation, Miyazaki, Kawasaki, 213 Japan

Description

Transition temperature (T/sub c/) control and annealing effects of Bi/sub 2.0/Sr/sub 1.4/Ca/sub 1.8/Cu/sub 2.2/O/sub y/ superconducting thin films implanted by 200 keV Ne+ have been investigated. T/sub c/ end points for 0.4-μm-thick Bi/sub 2.0/Sr/sub 1.4/Ca/sub 1.8/Cu/sub 2.2/O/sub y/ films for 0, 1 x 1012, and 1 x 1013 ions/cm2 doses are 78, 76, and 54 K, respectively. The ion dose, to achieve a nonsuperconductor for Bi/sub 2.0/Sr/sub 1.4/Ca/sub 1.8/Cu/sub 2.2/O/sub y/ films, is two or more orders of magnitude lower than that for YBa2Cu3O/sub 7-//sub x/ films. The c-lattice constant increases were observed for the implanted films. Moreover, it was confirmed that the superconducting characteristics for the implanted films are recovered by annealing in O2 atmosphere

Additional details

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
53
Journal Issue
21
Series
Appl. Phys. Lett.
Journal Page Range
2096-2098
ISSN
0003-6951
CODEN
APPLA